ROHM RD3L08DBLHRB Type N-Channel Single MOSFETs, 60 V Enhancement, 3-Pin TO-252 (TL) RD3L08DBLHRBTL

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Verpakkingsopties
RS-stocknr.:
687-458
Fabrikantnummer:
RD3L08DBLHRBTL
Fabrikant:
ROHM
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Merk

ROHM

Product Type

Single MOSFETs

Channel Type

Type N

Maximum Drain Source Voltage Vds

60V

Package Type

TO-252 (TL)

Series

RD3L08DBLHRB

Mount Type

Surface

Pin Count

3

Maximum Drain Source Resistance Rds

7.6mΩ

Channel Mode

Enhancement

Maximum Gate Source Voltage Vgs

±20 V

Typical Gate Charge Qg @ Vgs

22nC

Maximum Power Dissipation Pd

76W

Minimum Operating Temperature

-55°C

Maximum Operating Temperature

175°C

Width

6.8 mm

Height

2.3mm

Length

10.50mm

Standards/Approvals

RoHS, AEC-Q101

Automotive Standard

AEC-Q101

The ROHM Power MOSFET is engineered for demanding applications requiring high efficiency and robust performance. This 60V, 80A N channel MOSFET features ultra-low on-resistance, delivering superior electrical performance while ensuring reliability. It is designed to operate optimally in various environments, making it ideal for automotive applications, including advanced driver assistance systems (ADAS) and lighting. With compliance to AEC-Q101 and 100% avalanche testing, this component ensures high standards of safety and efficiency in any electronic design. Its compact packaging enables easy integration into space-constrained layouts.

Delivers low on resistance of 7.6mΩ, enhancing efficiency in power transfer

Rated for a maximum continuous drain current of 80A, ensuring reliability under significant loads

Features a wide drain-source voltage of 60V suitable for various high-voltage applications

All products are RoHS compliant, supporting environmentally friendly designs

100% avalanche tested for increased reliability and component longevity

Designed in a DPAK TO-252 package for easy mounting in compact circuits

Offers a broad operating temperature range from -55°C to 175°C, ensuring performance in extreme conditions

Qualified to AEC Q101 , making it ideal for automotive and high-reliability applications

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